Area
Thin-film analysis in Belgium
Methods for the thickness, density, structure, optical constants and interfaces of thin films and multilayers, with the number of Belgian facilities that publish each capability and the cities they are in.
- X-ray reflectivityThin-film layer thickness, density, and interface or surface roughness from specular X-ray reflectivity.3 facilities
- Spectroscopic ellipsometryOptical constants and thickness of suitable films through an optical model.4 facilities
- X-ray diffractionCrystalline phase, structure, texture, and strain by X-ray diffraction.9 facilities
- Transmission electron microscopyTransmission-electron imaging or diffraction of electron-transparent specimens.5 facilities
- Atomic force microscopyNanoscale surface topography and roughness with probe-mode-dependent property mapping.7 facilities
- X-ray photoelectron spectroscopyElemental composition and chemical state of the near-surface region, optionally with sputter depth profiling.6 facilities
Facilities by city
Belgian facilities that publish at least one of these methods. A facility on several sites counts once in each city.
Potential Belgian facilities
21 facilities publish at least one of these methods in Namur, Brussels, Louvain-la-Neuve, Ghent, Leuven, Mons, Antwerp, Diepenbeek, Liège and Pajottegem.
Leads are based on published capabilities; current suitability and availability must be confirmed with the laboratory.
Describe your sample and question. The first answer is free and needs no account; laboratory names are shown in a free workspace.
Problems in this area
- Thin-film thickness: choosing a measurementEllipsometry, X-ray reflectivity or a cross-section? How film type, thickness range and stack decide the measurement, and what to prepare.
- Coating delamination: finding the causeHow to investigate a coating that lifts, blisters or peels: which measurements show where the failure runs and why, and what to prepare.