Method · AFM
Atomic force microscopy in the Netherlands, Belgium and Germany
Local surface topography and height differences measured with a scanning probe. What it answers, what it cannot establish on its own, what a laboratory will ask, and which Dutch, Belgian and German facilities publish it — named, with their sources.
What it answers
- What is the roughness of a small area, down to sub-nanometre height differences?
- How high are steps, grains or other nanoscale features?
- Did polishing, deposition or etching change the nanoscale topography?
What it cannot establish alone
- Determine chemical identity from topography alone; chemical analysis needs a separate or specialised coupled method.
- Reproduce every narrow trench or steep sidewall: tip geometry limits access and affects apparent lateral dimensions.
- Represent a whole component with a single small scan; roughness depends on scan size and data processing.
- Guarantee an undisturbed surface when the sample is soft, mobile or poorly attached.
Before you contact a laboratory
What a laboratory will ask.
A laboratory can say whether it can help only when these are known. Unknowns are fine; say so.
- Material, sample dimensions and the location of the surface to scan.
- Expected roughness, feature height and lateral size, and the requested scan area.
- Whether probe interaction is acceptable and whether the surface is soft, sticky or loosely attached.
- Air or liquid measurement, number of locations and the roughness parameters or step heights required.
A question a laboratory can answer
We polish sapphire substrates for thin-film deposition and need roughness over 5 × 5 µm and 20 × 20 µm areas on three substrates, before and after cleaning.
Each laboratory below can turn these into an editable enquiry draft. Go to the laboratories
Laboratory evidence · AFM
Laboratories that publish AFM
Named facilities whose official pages describe AFM, each with its source, the dates behind it and what is still unconfirmed. Up to 12 per search, ordered by review level and then alphabetically — not ranked by suitability.
Start typing to see the cities the catalogue holds for this method. The city must match exactly: “Ede” does not find Enschede, and there is no distance search. Changing the method keeps your country and city.
An independent directory, not a booking service. Laboratories are listed from their own public pages. None has endorsed Argentum Field, paid for its position or seen this search.
For every laboratory below, whether it can accept your sample, external work or a booking — and its current configuration, availability, price and turnaround — needs the laboratory’s own confirmation. Cards show only what differs from this.
More laboratories match than the 12 shown. The cut follows source review status and then alphabetical order, not suitability — choose a city below, or a country above, to see others.
How to read a result
- Access route
- How the laboratory’s own page says outside users can work with it, read from that page by an AI assessment. It does not mean your request will be accepted.
- Not yet assessed
- Nobody has read the practical details from the source yet. Open the source; the access route and sample limits are unknown, not absent.
- Public source
- Extracted from an official page. A research lead; nobody has checked it.
- AI-normalised
- Structured by a pipeline from an official page, with its source and retrieval date. Still a lead.
- Human reviewed
- A named reviewer confirmed the cited source supports this method. The laboratory has not agreed to anything.
- Dates
- Under “Evidence and dates” on each card. Retrieved: when the catalogue recorded the source. Assessed: when practical text was read. Source updated: the date the page itself shows. None is a check that the instrument runs today.
- Attribution
- A card says so when a source ties the capability to a wider institution rather than this laboratory. That does not establish who owns the instrument.
More on the levels: what each evidence level means and never means.
Select two or three laboratories to compare their evidence and what remains unknown.
Advanced Analytics microscopy – MicroDiagnostics
Leipzig · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-23
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://www.izi.fraunhofer.de/en/central-facilities/advanced-analytics-technology-platform/microscopy.html
- Retrieved
- 2026-10-23
- Reviewed
- Not recorded
AG Schmidt-Mende – Hybrid Nanostructures laboratory, GebäudeP
Konstanz · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-23
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://www.schmidt-mende.uni-konstanz.de/research/laboratories/
- Retrieved
- 2026-10-23
- Reviewed
- Not recorded
AMO – AMICA cleanroom
Aachen · Germany · AFM
- Access
- Measurement service — the source describes access for external users
- Published limits
- Sample limit The Veeco Dimension 3100 entry lists 6-inch wafers; the Bruker Icon entry lists 8-inch wafers. Confirm the instrument and handling limits for your specimen. source (opens in a new tab)
- Measurement mode The Bruker Icon entry lists topography, electrical/conductive measurements, KPFM and magnetic measurements; special applications need special samples. source (opens in a new tab)
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-22Claims assessed 2026-10-27
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical evidence · AI source assessment, not confirmed by the laboratory
Method
The equipment list explicitly includes AFM instruments.
Scope AMICA characterization equipment
AMO cleanroom technology — Cleanroom Services; Characterization / Atomic Force Microscopes (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Access route · Measurement service
The listed equipment is offered to customers and partners through customized services.
Scope Listed AMICA equipment
AMO cleanroom technology — Cleanroom Services; Characterization / Atomic Force Microscopes (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Sample limit
The Veeco Dimension 3100 entry lists 6-inch wafers; the Bruker Icon entry lists 8-inch wafers. Confirm the instrument and handling limits for your specimen.
Scope Separate AFM instrument entries; not a universal sample acceptance limit
AMO cleanroom technology — Cleanroom Services; Characterization / Atomic Force Microscopes (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Measurement mode
The Bruker Icon entry lists topography, electrical/conductive measurements, KPFM and magnetic measurements; special applications need special samples.
Scope Bruker Icon AFM entry
AMO cleanroom technology — Cleanroom Services; Characterization / Atomic Force Microscopes (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://www.amo.de/en/what-we-do/cleanroom-technology/
- Retrieved
- 2026-10-22
- Reviewed
- Not recorded
AMOLF NanoLab Amsterdam
Amsterdam · Netherlands · AFM
- Access
- Equipment use — the source describes access for external users
- Published limits
- Sample limit The FastScan page lists specimens of 210 mm diameter and 15 mm thickness. These are equipment specifications; confirm acceptance of your sample. source (opens in a new tab)
- Measurement mode The FastScan page lists contact, tapping and peak-force tapping modes. source (opens in a new tab)
- Sample limit Materials require staff permission and equipment use requires training. source (opens in a new tab)
- The historical Veeco citation returned HTTP 404 in this tool. A current official AFM page was found; its FastScan specifications must not be merged with historical Veeco modes or limits.
- The historical Veeco AFM citation returned HTTP 404 on 2026-10-28. The separately assessed current AMOLF page describes a Bruker FastScan; old instrument modes must not be transferred to it.
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-08-29Claims assessed 2026-10-27
- Attribution
- Local attribution in catalogue evidence
Practical evidence · AI source assessment, not confirmed by the laboratory
Method
The current AFM page identifies a Bruker Dimension FastScan system.
Scope AMOLF NanoLab AFM page
AMOLF AFM: Bruker Dimension FastScan — AFM specifications (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Sample limit
The FastScan page lists specimens of 210 mm diameter and 15 mm thickness. These are equipment specifications; confirm acceptance of your sample.
Scope Bruker Dimension FastScan; not the historical Veeco instrument
AMOLF AFM: Bruker Dimension FastScan — AFM specifications (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Measurement mode
The FastScan page lists contact, tapping and peak-force tapping modes.
Scope Bruker Dimension FastScan
AMOLF AFM: Bruker Dimension FastScan — AFM specifications (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Access route · Equipment use
The facility describes open access including industrial partners; independent equipment use follows intake, safety and equipment training.
Scope Facility-wide access route, subject to project intake
AMOLF NanoLab Amsterdam — Introduction; General NanoLab rules; Access the AMOLF NanoLab (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Sample limit
Materials require staff permission and equipment use requires training.
Scope Facility-wide rules
AMOLF NanoLab Amsterdam — Introduction; General NanoLab rules; Access the AMOLF NanoLab (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Link status
- The historical Veeco AFM citation returned HTTP 404 on 2026-10-28. The separately assessed current AMOLF page describes a Bruker FastScan; old instrument modes must not be transferred to it.
- Recorded title
- Veeco Dimension 3100 AFM
- Retrieved
- 2026-08-29
- Reviewed
- Not recorded
Analysis of Solid Surfaces – AFKO, Institute of Physics
Chemnitz · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-22
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://www.tu-chemnitz.de/physik/AFKO/instrumentation.html.en
- Retrieved
- 2026-10-22
- Reviewed
- Not recorded
Chemistry & Physics of Interfaces (CPI), IMTEK
Freiburg · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-22
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://uni-freiburg.de/tf-imtek-cpi/scientific-instrumentation
- Retrieved
- 2026-10-22
- Reviewed
- Not recorded
CoCooN (Conformal Coating of Nanomaterials)
Ghent · Belgium · AFM
- Access
- Not yet assessed — open the source for access and sample limits
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-09-27
- Attribution
- Local attribution in catalogue evidence
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- Public evidence (Benelux R4 harvest)
- Retrieved
- 2026-09-27
- Reviewed
- Not recorded
Core Facility Hohenheim – Imaging Unit CFH-IMG
Stuttgart · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
- Source review (2026-10-29): The facility mentions external users. Its described independent user mode is for university members after safety and equipment training; confirm external access, suitability and availability.
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-23
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://cfh.uni-hohenheim.de/imaging.html
- Retrieved
- 2026-10-23
- Reviewed
- Not recorded
DESY NanoLab – Centre for X-ray and NanoScience (CXNS)
Hamburg · Germany · AFM
- Access
- Proposal-based access · Commercial enquiry · Research collaboration — the source describes access for external users
- Published limits
- unknown
- Institution/shared attribution; instrument ownership unconfirmed
- Sample size and material restrictions have not been established.
- Proposal access, commercial inquiry and cooperation are different routes; none establishes availability for this request.
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-22Claims assessed 2026-10-27
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical evidence · AI source assessment, not confirmed by the laboratory
Method
The instrumentation list explicitly includes AFM.
Scope DESY NanoLab instrumentation
DESY NanoLab access and instrumentation — ACCESS; DESY NanoLab INSTRUMENTATION (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Access route · Proposal-based access
Scientific access requires an accepted combined NanoLab/light-source proposal and a feasibility discussion.
Scope Proposal route, subject to acceptance
DESY NanoLab access and instrumentation — ACCESS; DESY NanoLab INSTRUMENTATION (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Access route · Commercial enquiry
Commercial users are directed to DESY Innovation and Technology Transfer; feasibility must be discussed.
Scope Commercial inquiry route; staff-operated measurement is not established
DESY NanoLab access and instrumentation — ACCESS; DESY NanoLab INSTRUMENTATION (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Access route · Research collaboration
Cooperation with the research group is another stated access route.
Scope Research cooperation route
DESY NanoLab access and instrumentation — ACCESS; DESY NanoLab INSTRUMENTATION (opens in a new tab) · assessed 2026-10-27 · source updated unknown
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://photon-science.desy.de/research/research_teams/x_ray_physics_and_nanoscience/desy_nanolab/index_eng.html
- Retrieved
- 2026-10-22
- Reviewed
- Not recorded
DFI materials and surface characterization laboratories
Bad Homburg v. d. Höhe · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-22
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://dechema-dfi.de/geraeteausstattung.html
- Retrieved
- 2026-10-22
- Reviewed
- Not recorded
DIK e.V. microscopy source inventory (undated brochure)
Hannover · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-23
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://www.dikautschuk.de/fileadmin/files/infomaterial/dik_flyer_mikroskopie.pdf
- Catalogue URL
- https://www.dikautschuk.de/fileadmin/files/infomaterial/dik_flyer_mikroskopie.pdf (opens in a new tab)
- Retrieved
- 2026-10-23
- Reviewed
- Not recorded
DWI Material Surface Analytics Unit
Aachen · Germany · AFM
- Access
- Not yet assessed — open the source for access and sample limits
- Institution/shared attribution; instrument ownership unconfirmed
Evidence and dates
- Catalogue evidence
- AI-normalised public source
- Dates
- Catalogue retrieved 2026-10-23
- Attribution
- Institution/shared attribution; instrument ownership unconfirmed
Practical details have not yet received a claim-specific source assessment.
Catalogue record
As recorded. A recorded title is catalogue metadata, not a statement that the page supports AFM. Practical details are AI source assessments of indexed official text; an assessment date is not a fresh fetch or a check that the instrument operates.
- Recorded title
- German source review: https://www.dwi.rwth-aachen.de/en/page/material-surface-analytics-unit
- Catalogue URL
- https://www.dwi.rwth-aachen.de/en/page/material-surface-analytics-unit (opens in a new tab)
- Retrieved
- 2026-10-23
- Reviewed
- Not recorded
Not sure AFM answers your question? Describe your sample and question and the first answer suggests a method and leads, without an account.
Often combined with
- Stylus profilometryContact measurement of step height, film thickness, and surface profile.
- Optical profilometryNon-contact areal surface topography, roughness, and step-height measurement.
- X-ray reflectivityThin-film layer thickness, density, and interface or surface roughness from specular X-ray reflectivity.
- SEM with EDXScanning electron microscopy combined with elemental point analysis or mapping.
Problems where it helps
- Coating failure analysis: from symptom to causeHow to analyse a coating that cracks, discolours, corrodes or wears: compare failed and intact parts and test the likely explanations.