Method · XRR
X-ray reflectivity in the Netherlands, Belgium and Germany
Model-based thickness, electron density and interface roughness of thin layers on sufficiently flat, smooth samples. What it answers, what it cannot establish on its own, what a laboratory will ask, and which Dutch, Belgian and German facilities publish it — named, with their sources.
What it answers
- How thick is each layer of a thin-film stack, from about a nanometre to a few hundred nanometres?
- What are the layer densities and interface roughnesses?
- Did a deposition or annealing step change thickness or density?
What it cannot establish alone
- A unique layer structure from every reflectivity curve; thickness, density and roughness can be correlated in the fitted model.
- Chemical identity or crystal phase by itself. Converting electron density to mass density requires composition assumptions.
- Reliable layer parameters when roughness, curvature, weak interface contrast or thickness variation obscure the reflectivity features.
Before you contact a laboratory
What a laboratory will ask.
A laboratory can say whether it can help only when these are known. Unknowns are fine; say so.
- Substrate, expected layer materials, layer order and approximate thicknesses.
- Sample dimensions, flatness, roughness and the size of the uniform coated area.
- Whether you need thickness only or also density and roughness, and any independent measurements to constrain the model.
- Number of samples and measurement positions, including any reference sample.
A question a laboratory can answer
We deposit a nominal 40 nm silicon nitride film on 25 mm silicon wafers. We want thickness, density and roughness for three wafers from different runs, fitted with a two-layer model.
Each laboratory below can turn these into an editable enquiry draft. Go to the laboratories
Laboratory evidence · XRR
Laboratories that publish XRR
Named facilities whose official pages describe XRR, each with its source, the dates behind it and what is still unconfirmed. Up to 12 per search, ordered by review level and then alphabetically — not ranked by suitability.
Start typing to see the cities the catalogue holds for this method. The city must match exactly: “Ede” does not find Enschede, and there is no distance search. Changing the method keeps your country and city.
An independent directory, not a booking service. Laboratories are listed from their own public pages. None has endorsed Argentum Field, paid for its position or seen this search.
For every laboratory below, whether it can accept your sample, external work or a booking — and its current configuration, availability, price and turnaround — needs the laboratory’s own confirmation. Cards show only what differs from this.
No source-backed XRR laboratory for Belgium · Pajottegem.
No laboratory in the catalogue publishes XRR there with an official source. That does not establish that no suitable laboratory exists — the city must match exactly, and the catalogue is not complete.
Often combined with
- Atomic force microscopyNanoscale surface topography and roughness with probe-mode-dependent property mapping.
- X-ray diffractionCrystalline phase, structure, texture, and strain by X-ray diffraction.
Problems where it helps
- Thin-film thickness: choosing a measurementEllipsometry, X-ray reflectivity or a cross-section? How film type, thickness range and stack decide the measurement, and what to prepare.